Date and Time: April 23rd 2021 | 15:00 p.m. SGT

Topic 1:
Chasing Zero – An Exploration of Recent
Agilent’s Semiconductor Ultra Trace Analysis
Solutions

Speaker: Steven Pang, Agilent Technologies

The development of ICP-MS analysis for the semiconductor industry has been proceeding at an unprecedented pace in tandem with the rapid technological advances. In keeping pace with these advances, ICP-MS analysts have demanded ever lower detection capabilities and in increasingly challenging sample matrices.

In this webinar, recent ultra-trace analysis solutions for the semiconductor industry will be presented to help semiconductor users meet the ever-changing landscape of semiconductor analysis l. Specifically, these will cover both hardware as well as application previews of recent applications. The presentation will benefit key stakeholders of the semiconductor industry.

Topic 1:
Chasing Zero – An Exploration of Recent
Agilent’s Semiconductor Ultra Trace Analysis
Solutions

Speaker: Dr. Caroline Widdowson

Volatile organic compounds (VOCs) can cause adverse effects to a variety of products created in sensitive manufacturing environments, from silicon wafers to lithographic lenses. VOCs can emit from the materials used to manufacture the cleanrooms, from other materials used to produce the products as well as from the workforce. In this presentation we will review the advances in technology to allow accurate and reproducible monitoring of airborne contaminants in the cleanroom environment as well as from individual materials. This technology enables industry to make informed decisions on facility design, troubleshoot production concerns, carry out QC and certify final products.