With the newest model of Bruker’s micro-XRF family, you can find out more about your sample than XRF ever showed you before.
With its super-light element detectors, the M4 TornadoPlus is the first micro-XRF scanner able to measure any element from carbon upwards. Additionally, the performance of all light elements is strongly increased.
On this instrument, Bruker introduced the patented aperture management system (AMS) that enhances the depth of focus of the polycapillary lens for sharper element mappings of uneven samples. The optional second X-ray source further extends the analytical capabilities with its four selectable spot sizes from 0.5 to 4.5 mm.
The chamber of the M4 Tornado family offers an option for He-flush. This increases the light-element performance while maintaining atmospheric pressure in the chamber. Light elements in biological or wet specimens can be analyzed without the need to freeze or dry the samples.
| Features | Benefits |
|---|---|
| Dual, large-area silicon drift detectors (SDD) with super light element window | Detection and analysis of light elements down to carbon |
| High throughput pulse processor | Reduced acquisition time, increased productivity |
| Innovative Aperture Management System (AMS) | High depth of field to keep more features and details in focus when investigating topographic samples |
| Quick-change stage with optional specimen holders | Reduced sample exchange and setup time |
| Second X-ray tube with automatic four position collimator changer (optional) | More flexibility for the analysis of high energy lines |
| Programmable He-purge system (optional) | Light element analysis at atmospheric pressure |
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