Total reflection X-ray fluorescence (TXRF) spectroscopy is a wellestablished method for trace element analysis of a variety of samples.

The S4 T-Star simplifies TXRF for 24/7 routine operation with guaranteed data quality. Significant improvements of detection limits are accompanied by automatic QC procedures, useful software routines and a unique versatility in terms of sample types and carriers.

Outstanding Sample Versatility

The S4 T-Star is a very versatile tool for the analysis of a great variety of sample types on different reflective carriers. This puts it ahead of ICP, which requires fully dissolved liquid samples:

• 30 mm quartz discs: elemental analysis of liquids, solids and suspensions
• 2″ wafer: contamination analysis, depth profiling and material sciences research
• Microscopy slides: clinical and biological samples, direct analysis of cell cultures, smears and thin sections
• Rectangular carriers up to 54 mm: films, filters, nanoparticle layers
• Any customized reflective media

Benefits:

• The high performance TXRF spectrometer S4 T-Star offers lowest detection limits in the sub-ppb range.
• Automatic quality control routines guarantee consistently highest data quality.
• Maximum versatility for a direct analysis of many types of samples on different carriers.
• Optimized for 24/7 operation in industrial routine analysis.
• Designed for multi-user operation with a high capacity of 90 samples.
• A selection of sample trays and other tools accelerates sample preparation and minimizes errors and contamination risks.
• High quality results for sophisticated research in material sciences.
• A dedicated application team supporting your method development and standardization processes.

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